Thermal deposition analysis during disruptions on DIII-D using infrared scanners GA-A-22217 DE97 003797 CONF-95090543

Thermal deposition analysis during disruptions on DIII-D using infrared scanners

GA-A-22217 DE97 003797 CONF-95090543

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 規格・テクニカルリポート類
Title: Thermal deposition analysis during disruptions on DIII-D using infrared scanners
Author/Editor: Lee, R. L
Hyatt, A. W
Kellman, A. G
Taylor, P. L
Lasnier, C. J
Publication Date: 1995
Publication Date (W3CDTF): 1995
Extent: 7 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : GA-A-22217
テクニカルリポート番号 : DE97 003797
テクニカルリポート番号 : CONF-95090543
Holding library: 国立国会図書館
Call No.: LS-DE97/003797
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005872300
http://id.ndl.go.jp/bib/000005872300
Bibliographic Record Category (NDL): 291