Backside localization of open and shorted IC interconnections SAND981652C DE98 003971 CONF980320

Backside localization of open and shorted IC interconnections

SAND981652C DE98 003971 CONF980320

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Material Type: 規格・テクニカルリポート類
Title: Backside localization of open and shorted IC interconnections
Author/Editor: Cole, E. I
Tangyunyong, P
Barton, D. L
Publication Date: 1998
Publication Date (W3CDTF): 1998
Extent: 8 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND981652C
テクニカルリポート番号 : DE98 003971
テクニカルリポート番号 : CONF980320
Holding library: 国立国会図書館
Call No.: LS-DE98/003971
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005885068
http://id.ndl.go.jp/bib/000005885068
Bibliographic Record Category (NDL): 291