Atomic-scale properties of semiconductor heterostructures probed by scanning tunneling microscopy SAND981035C DE98 005465 CONF980604

Atomic-scale properties of semiconductor heterostructures probed by scanning tunneling microscopy

SAND981035C DE98 005465 CONF980604

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Material Type: 規格・テクニカルリポート類
Title: Atomic-scale properties of semiconductor heterostructures probed by scanning tunneling microscopy
Author/Editor: Yu, E. T
Zuo, S. L
Bi, W. G
Tu, C. W
Biefeld, R. M
Publication Date: 1998
Publication Date (W3CDTF): 1998
Extent: 11 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND981035C
テクニカルリポート番号 : DE98 005465
テクニカルリポート番号 : CONF980604
Holding library: 国立国会図書館
Call No.: LS-DE98/005465
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005897252
http://id.ndl.go.jp/bib/000005897252
Bibliographic Record Category (NDL): 291