Point defects in semiconductors / M. Lannoo, J. Bourgoin.

• Material Type: 図書
• ISBN: 0387105182 (U.S. : v. 1); 0387115153 (U.S. : v. 2)
• Title: Point defects in semiconductors / M. Lannoo, J. Bourgoin.
• Series Title: Springer series in solid-state sciences ; 22, 35
• Author Heading: Lannoo, M. (Michel) , 1942-; Bourgoin, J. (Jacques) , 1938-
• Publication, Distribution, etc.: Berlin : Springer-Verlag; New York : Springer-Verlag
• Publication Date: 1981.
• Publication Date (W3CDTF): 1981
• Extent: 2 v. : ill. ; 24 cm.
• Place of Publication (Country Code): DE
• Text Language Code: eng
• Subject Heading: Semiconductors -- Defects.; Point defects.
• LCC: QC611.6.D4
• DDC: 537.6/22
• NDLC: MC151
• Note (General): Vol. 2 by J. Bourgoin, M. Lannoo, with a foreword by G.D. Watkins.
• Note (Bibliography): Includes bibliographical references and index.
• Holding library: 国立国会図書館
• Call No.: MC151-53
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000006251276; http://id.ndl.go.jp/bib/000006251276
• LC Control Number: 81005354 //r83; https://lccn.loc.gov/81005354
• Bibliographic Record Category (NDL): 211

• Contents: 1. Theoretical aspects2. Experimental aspects.(Provided by: 国立国会図書館蔵書)