X-ray analysis papers; a volume of twenty-four selected reprints from Philips Laboratories, Briarcliff Manor, New York, U.S.A. [2d ed.]

X-ray analysis papers; a volume of twenty-four selected reprints from Philips Laboratories, Briarcliff Manor, New York, U.S.A.

[2d ed.]

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Note (General)：: Second edition of Advances in X-ray diffractometry and X-ray spectrography.

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Material Type: 図書
Title: X-ray analysis papers; a volume of twenty-four selected reprints from Philips Laboratories, Briarcliff Manor, New York, U.S.A.
Edition: [2d ed.]
Author Heading: Parrish, William, 1914-
Publication, Distribution, etc.: Eindhoven : Centrex Pub. Co.
Publication Date: c1965.
Publication Date (W3CDTF): 1965
Extent: 311 p. illus. 28 cm.
Text Language Code: eng
Subject Heading: X-ray crystallography.
Cristalografia De Raios X.
Espectroscopia De Raios X.
DDC: 545.8
Note (General): Second edition of Advances in X-ray diffractometry and X-ray spectrography.
Holding library: 国立国会図書館
Call No.: 545.8-P261x
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006295815
http://id.ndl.go.jp/bib/000006295815
Bibliographic Record Category (NDL): 211