Digest of papers ... Test Conference.

• Material Type: 図書
• Title: Digest of papers ... Test Conference.
• Author Heading: IEEE Computer Society. Test Technology Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.; Test Conference.
• Publication, Distribution, etc.: New York : Institute of Electrical and Electronics Engineers
• Publication Date: 1979-1980.
• Publication Date (W3CDTF): 1979
• Extent: 2 v. ; ill. ; 28 cm.
• Alternative Title: IEEE ... Semiconductor Test Conference 1979; IEEE ... Test Conference 1980
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Computer storage devices -- Congresses.; Semiconductor storage devices -- Congresses.; Semiconductors -- Testing -- Congresses.
• NDLC: ND386
• Note (General): Each conference also has distinctive title.
• Note (Bibliography): Includes bibliographical references.
• Holding library: 国立国会図書館
• Call No.: ND386-21
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000006409335; http://id.ndl.go.jp/bib/000006409335
• Bibliographic Record Category (NDL): 211