Condensed guide for the Stanford revision of the Binet-Simon intelligence tests, by Lewis M. Terman. (Riverside textbooks in education)

Condensed guide for the Stanford revision of the Binet-Simon intelligence tests, by Lewis M. Terman.

(Riverside textbooks in education)

Notes on use

Note (General)：: "Abbreviated filing record card for the Stanford revision of the Binet-Simon tests": 1 fold. form laid in.

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Material Type: 図書
Title: Condensed guide for the Stanford revision of the Binet-Simon intelligence tests, by Lewis M. Terman.
Series Title: Riverside textbooks in education
Author Heading: Terman, Lewis Madison, 1877-1956.
Publication, Distribution, etc.: Boston : Houghton Mifflin
Publication Date: [c1920]
Publication Date (W3CDTF): 1920
Extent: 32 p. 22 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Intelligence tests.
Stanford-Binet Test.
Binet-Simon Test.
LCC: LB1131
Note (General): "Abbreviated filing record card for the Stanford revision of the Binet-Simon tests": 1 fold. form laid in.
Holding library: 国立国会図書館
Call No.: 227-409
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006476777
http://id.ndl.go.jp/bib/000006476777
LC Control Number: 20010063
https://lccn.loc.gov/20010063
Bibliographic Record Category (NDL): 211