図書

A FORTRAN program for analysis of data from microelectronic test structures / Richard L. Mattis (NBS special publication ; 400-75) (Semiconductor measurement technology)

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A FORTRAN program for analysis of data from microelectronic test structures / Richard L. Mattis

(NBS special publication ; 400-75) (Semiconductor measurement technology)

Call No. (NDL)
YCA-C 13.10:400-75
Bibliographic ID of National Diet Library
000006510046
Material type
図書
Author
Mattis, Richard Lほか
Publisher
-
Publication date
1983
Material Format
Microform
Capacity, size, etc.
microfiche ; 11 × 15 cm
NDC
-
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Notes on use

Note (General)：

Distributed to depository libraries in microfiche"Issued July 1983."Microfiches in pocket...

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Microform

Material Type
図書
Title
A FORTRAN program for analysis of data from microelectronic test structures / Richard L. Mattis
Series Title
NBS special publication ; 400-75
Semiconductor measurement technology
Author Heading
Mattis, Richard L
United States. National Bureau of Standards
Publication Date (W3CDTF)
1983
Extent
microfiche
Size
11 × 15 cm
Place of Publication (Country Code)
US
Text Language Code
eng
Note (Material Type)
[microform]