A FORTRAN program for analysis of data from microelectronic test structures / Richard L. Mattis

• Material Type: 図書
• Title: A FORTRAN program for analysis of data from microelectronic test structures / Richard L. Mattis
• Series Title: NBS special publication ; 400-75; Semiconductor measurement technology
• Author Heading: Mattis, Richard L; United States. National Bureau of Standards
• Publication Date (W3CDTF): 1983
• Extent: microfiche
• Size: 11 × 15 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Note (Material Type): [microform]
• Subject Heading: Computer programs -- Testing
• Note (General): Distributed to depository libraries in microfiche; "Issued July 1983."; Microfiches in pocket; Physical description for original version: 1 v. (various pagings) : 28 cm. +
• Note (Bibliography): Includes bibliographical references
• Note (Original Version): 原資料の出版事項: Washington, DC : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1983; SUPTDOC番号: C 13.10: 400-75; GPO管理番号: 247 (microfiche)
• Holding library: 国立国会図書館
• Call No.: YCA-C 13.10:400-75
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000006510046; http://id.ndl.go.jp/bib/000006510046
• GPO No.: 84008029
• Bibliographic Record Category (NDL): 281