A FORTRAN program for analysis of data from microelectronic test structures / Richard L. Mattis (NBS special publication ; 400-75) (Semiconductor measurement technology)

A FORTRAN program for analysis of data from microelectronic test structures / Richard L. Mattis

(NBS special publication ; 400-75) (Semiconductor measurement technology)

Call No. (NDL): YCA-C 13.10:400-75
Bibliographic ID of National Diet Library: 000006510046

Material type: 図書

Author: Mattis, Richard Lほか

Publisher: -

Publication date: 1983

Material Format: Microform

Capacity, size, etc.: microfiche ; 11 × 15 cm

NDC: -

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Note (General)：: Distributed to depository libraries in microfiche"Issued July 1983."Microfiches in pocket...

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Material Type: 図書
Title: A FORTRAN program for analysis of data from microelectronic test structures / Richard L. Mattis
Series Title: NBS special publication ; 400-75
Semiconductor measurement technology
Author Heading: Mattis, Richard L
United States. National Bureau of Standards
Publication Date (W3CDTF): 1983
Extent: microfiche
Size: 11 × 15 cm
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Computer programs -- Testing
Note (General): Distributed to depository libraries in microfiche
"Issued July 1983."
Microfiches in pocket
Physical description for original version: 1 v. (various pagings) : 28 cm. +
Note (Bibliography): Includes bibliographical references
Note (Original Version): 原資料の出版事項: Washington, DC : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1983
SUPTDOC番号: C 13.10: 400-75
GPO管理番号: 247 (microfiche)
Holding library: 国立国会図書館
Call No.: YCA-C 13.10:400-75
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006510046
http://id.ndl.go.jp/bib/000006510046
GPO No.: 84008029
Bibliographic Record Category (NDL): 281