Development of a testing methodology to predict optical disk life expectancy values [microform] / Fernando L. Podio

• Material Type: 図書
• Title: Development of a testing methodology to predict optical disk life expectancy values [microform] / Fernando L. Podio
• Series Title: NIST special publication ; 500-200. Computer systems technology
• Title Heading: NIST special publication ; 500-200; NIST special publication. Computer systems technology
• Author Heading: Podio, Fernando L; National Institute of Standards and Technology (U.S.)
• Publication Date (W3CDTF): 1991
• Extent: microfiche
• Size: 11 × 15 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Note (Material Type): [microform]
• Subject Heading: Optical disks -- Testing; Service life (Engineering)
• Note (General): Distributed to depository libraries in microfiche; Shipping list no.: 92-2116-M; Paper version no longer for sale by the Supt. of Docs; "December 1991."; Physical description for original version: xv, 84 p. : 28 cm
• Note (Bibliography): Includes bibliographical references (p. 83-84)
• Note (Original Version): 原資料の出版事項: Gaithersburg, MD ; [Springfield, VA : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology : Order from National Technical Information Service], 1991; SUPTDOC番号: C 13.10: 500-200; GPO管理番号: 0247 (MF)
• Holding library: 国立国会図書館
• Call No.: YCA-C 13.10:500-200
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000006585986; http://id.ndl.go.jp/bib/000006585986
• OCLC No.: 26981476; https://www.worldcat.org/oclc/26981476
• Bibliographic Record Category (NDL): 281