図書

The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon [microform] / Barbara J. Belzer and David L. Blackburn (Semiconductor measurement technology) (NIST special publication ; 400-99)

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The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon [microform] / Barbara J. Belzer and David L. Blackburn

(Semiconductor measurement technology) (NIST special publication ; 400-99)

Call No. (NDL)
YCA-C 13.10:400-99
Bibliographic ID of National Diet Library
000006613283
Material type
図書
Author
Belzer, Barbara Jほか
Publisher
-
Publication date
1997
Material Format
Microform
Capacity, size, etc.
microfiche ; 11 × 15 cm
NDC
-
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Shipping list no.: 98-0569-MPaper version no longer for sale by the Supt. of Docs"May 1997."...

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Microform

Material Type
図書
Publication Date (W3CDTF)
1997
Extent
microfiche
Size
11 × 15 cm
Alternative Title
Results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon
Place of Publication (Country Code)
US
Text Language Code
eng