Simulation of tip-sample interaction in the atomic force microscope [microform] / Brian S. Good and Amitava Banerjea (NASA-TM ; 111699)

Simulation of tip-sample interaction in the atomic force microscope [microform] / Brian S. Good and Amitava Banerjea

(NASA-TM ; 111699)

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Note (General)：: Shipping list no.: 98-0791-MPhysical description for original version: 1 v

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Material Type: 図書
Title: Simulation of tip-sample interaction in the atomic force microscope [microform] / Brian S. Good and Amitava Banerjea
Series Title: NASA-TM ; 111699
Title Heading: NASA technical memorandum ; 111699
Author Heading: Good, Brian S
Banerjea, Amitava
United States. National Aeronautics and Space Administration
Publication Date (W3CDTF): 1994
Extent: microfiche
Size: 11 × 15 cm
Alternative Title: Simulation of tip sample interaction in the atomic force microscope
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: Computerized simulation
Atomic force microscopy
Interatomic forces
Crystal surfaces
Microscopes
Note (General): Shipping list no.: 98-0791-M
Physical description for original version: 1 v
Note (Original Version): 原資料の出版事項: [Washington, D.C. ; Springfield, Va. : National Aeronautics and Space Administration : National Technical Information Service, distributor, 1994]
SUPTDOC番号: NAS 1.15: 111699
GPO管理番号: 0830-D (MF)
Holding library: 国立国会図書館
Call No.: YCA-NAS 1.15:111699
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006614972
http://id.ndl.go.jp/bib/000006614972
OCLC No.: 39655964
https://www.worldcat.org/oclc/39655964
Bibliographic Record Category (NDL): 281