Testability of product data management interfaces [microform] / David Flater, KC Morris (NISTIR ; 6429)

Testability of product data management interfaces [microform] / David Flater, KC Morris

(NISTIR ; 6429)

Notes on use

Note (General)：: Shipping list no.: 2000-0425-M"November 1999."Physical description for original version: 20 p.

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Material Type: 図書
Title: Testability of product data management interfaces [microform] / David Flater, KC Morris
Series Title: NISTIR ; 6429
Author Heading: Flater, David
Morris, K. C
National Institute of Standards and Technology (U.S.)
Publication Date (W3CDTF): 1999
Extent: microfiche
Size: 11 × 15 cm
Place of Publication (Country Code): US
Text Language Code: eng
Note (Material Type): [microform]
Subject Heading: CAD/CAM systems -- Specifications -- United States
CAD/CAM systems -- United States -- Testing
Computer interfaces -- Specifications -- United States
Computer interfaces -- United States -- Testing
Note (General): Shipping list no.: 2000-0425-M
"November 1999."
Physical description for original version: 20 p.
Note (Bibliography): Includes bibliographical references (p. 18-20)
Note (Original Version): 原資料の出版事項: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1999]
SUPTDOC番号: C 13.58: 6429
GPO管理番号: 0247-D (MF)
Holding library: 国立国会図書館
Call No.: YCA-C 13.58:6429
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000006631859
http://id.ndl.go.jp/bib/000006631859
OCLC No.: 43877144
https://www.worldcat.org/oclc/43877144
Bibliographic Record Category (NDL): 281