Twentieth annual IEEE semiconductor thermal measurement and management symposium : March 9-11, 2004 : Fairmont Hotel : San Jose, CA USA. : SEMI-THERM 20 : Mar 2004, San Jose, CA.

• Material Type: 図書
• ISBN: 078038363X (softbound ed.); 0780383648 (CD-ROM ed.)
• ISSN: 1065-2221
• Title: Twentieth annual IEEE semiconductor thermal measurement and management symposium : March 9-11, 2004 : Fairmont Hotel : San Jose, CA USA. : SEMI-THERM 20 : Mar 2004, San Jose, CA.
• Author Heading: IEEE Semiconductor Thermal Measurement and Management Symposium (20th : 2004 : San Jose, Calif.)
• Publication, Distribution, etc.: Piscataway : IEEE
• Publication Date: c2004.
• Publication Date (W3CDTF): 2004
• Extent: xiii, 313 p. : ill. ; 28 cm.
• Alternative Title: 20th annual IEEE semiconductor thermal measurement and management symposium : March 9-11, 2004 : Fairmont Hotel : San Jose, CA USA; Twentieth annual IEEE semiconductor thermal measurement and management symposium : proceedings 2004 : San Jose, CA USA : March 9-11, 2004 : sessions: system-level thermal (...)
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Semiconductors -- Thermal properties -- Congresses.; Semiconductors -- Cooling -- Congresses.
• NDLC: M17
• Note (General): Papers.; IEEE cat no 04CH37545 (softbound) , 04CH37545C (CD-ROM) .
• Note (Bibliography): Includes bibliographic references.
• Note (Additional Physical Form Available): Also available via the World Wide Web.
• Holding library: 国立国会図書館
• Call No.: M17-04-3486
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000007543739; http://id.ndl.go.jp/bib/000007543739
• RLIN No.: MOHG54797571-B
• Bibliographic Record Category (NDL): 215