Capacitance cell measurement of the out-of-plane expansion of thin films / Chad R. Snyder, Frederick I. Mopsik. (NIST recommended practice guide) (Special publication ; 960-7)

Capacitance cell measurement of the out-of-plane expansion of thin films / Chad R. Snyder, Frederick I. Mopsik.

(NIST recommended practice guide) (Special publication ; 960-7)

Call No. (NDL): AU-411-B8
Bibliographic ID of National Diet Library: 000007559288

Material type: 図書

Author: National Institute of Standards and Technology (U.S.)

Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology

Publication date: [2003]

Material Format: Paper

Capacity, size, etc.: x, 32 p. : ill. ; 23 cm.

NDC: -

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Notes on use

Note (General)：: "November 2001."

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Paper

Material Type: 図書
Title: Capacitance cell measurement of the out-of-plane expansion of thin films / Chad R. Snyder, Frederick I. Mopsik.
Series Title: NIST recommended practice guide
Special publication ; 960-7
Title Heading: NIST special publication ; 960-7.
Author Heading: National Institute of Standards and Technology (U.S.)
Publication, Distribution, etc.: [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Publication Date: [2003]
Publication Date (W3CDTF): 2003
Extent: x, 32 p. : ill. ; 23 cm.
Place of Publication (Country Code): US
Text Language Code: eng
NDLC: AU-411
Note (General): "November 2001."
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: AU-411-B8
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000007559288
http://id.ndl.go.jp/bib/000007559288
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 211

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