22nd IEEE VLSI test symposium : proceedings : 25-29 April 2004 : Napa Valley, California. (IEEE VLSI Test Symposium)

22nd IEEE VLSI test symposium : proceedings : 25-29 April 2004 : Napa Valley, California.

(IEEE VLSI Test Symposium)

Notes on use

Note (General)：: Papers.IEEE cat no PR2134 (t. p. verso) , P2134 (back cover) .

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 図書
ISBN: 0769521347
ISSN (series): 1093-0167
Title: 22nd IEEE VLSI test symposium : proceedings : 25-29 April 2004 : Napa Valley, California.
Series Title: IEEE VLSI Test Symposium
Author Heading: IEEE VLSI Test Symposium (22nd : 2004 : Napa Valley, California)
Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
Publication Date: c2004.
Publication Date (W3CDTF): 2004
Extent: xxvii, 406 p. : ill. ; 28 cm.
Additional Title: VTS 2004 : Apr 2004, Napa Valley, CA.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Very large scale integration -- Testing. -- Congresses.
NDLC: M17
Note (General): Papers.
IEEE cat no PR2134 (t. p. verso) , P2134 (back cover) .
Note (Bibliography): Includes bibliographic references and author index.
Holding library: 国立国会図書館
Call No.: M17-05-433
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000007624842
http://id.ndl.go.jp/bib/000007624842
RLIN No.: MOHG55109961-B
Bibliographic Record Category (NDL): 215