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2004 IEEE international workshop on current & defect based testing (DBT 2004) : proceedings : April 25, 2004 : Napa Valley Marriott, Napa Valley, CA, USA. : DBT-2004 : Apr 2004, Napa Valley, CA.

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2004 IEEE international workshop on current & defect based testing (DBT 2004) : proceedings : April 25, 2004 : Napa Valley Marriott, Napa Valley, CA, USA. : DBT-2004 : Apr 2004, Napa Valley, CA.

Call No. (NDL)
M17-05-2561
Bibliographic ID of National Diet Library
000007999194
Material type
図書
Author
Menon, Sankaran M.ほか
Publisher
IEEE
Publication date
c2004.
Material Format
Paper
Capacity, size, etc.
ix, 112, [1] p. : ill. ; 28 cm.
NDC
-
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Notes on use

Note (General)：

An abstract and papers.Held in conjunction with the VLSI test symposium (VTS2004) .IEEE cat no 04EX1004.

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Paper

Material Type
図書
ISBN
0780389506
Title
2004 IEEE international workshop on current & defect based testing (DBT 2004) : proceedings : April 25, 2004 : Napa Valley Marriott, Napa Valley, CA, USA. : DBT-2004 : Apr 2004, Napa Valley, CA.
Author Heading
Menon, Sankaran M.
IEEE International Workshop on Defect Based Testing (2004 : Napa, Calif.)
IEEE VLSI Test Symposium (2004 : Napa, Calif.)
Publication, Distribution, etc.
Piscataway : IEEE
Publication Date
c2004.
Publication Date (W3CDTF)
2004
Extent
ix, 112, [1] p. : ill. ; 28 cm.
Alternative Title
2004 IEEE international workshop on current and defect based testing (DBT 2004) : proceedings : April 25, 2004 : Napa Valley Marriott, Napa Valley, CA, USA
2004 IEEE international workshop on defect based testing (DBT)
Place of Publication (Country Code)
US