ICMTS 2006 : proceedings of the 2006 international conference on microelectronic test structures : Hyatt on Town Lake : Austin, Texas : March 6-9, 2006. : 19th annual ICMTS : Mar 2006, Austin, TX.

Author: IEEE International Conference on Microelectronic Test Structures (2006 : Austin, Tex.)

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Material Type: 図書
ISBN: 1424401674
Title: ICMTS 2006 : proceedings of the 2006 international conference on microelectronic test structures : Hyatt on Town Lake : Austin, Texas : March 6-9, 2006. : 19th annual ICMTS : Mar 2006, Austin, TX.
Author Heading: IEEE International Conference on Microelectronic Test Structures (2006 : Austin, Tex.)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2006.
Publication Date (W3CDTF): 2006
Extent: x, 230, 3 p. : ill. ; 28 cm.
Alternative Title: 2006 IEEE international conference on microelectronics test structures : Austin, TX : 6-9 March 2006
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Testing -- Congresses.
Semiconductors -- Testing -- Congresses.
Electronic apparatus and appliances -- Testing -- Congresses.
NDLC: M17
Note (General): Papers.
IEEE cat no 06CH37771.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-07-1509
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000008580754
http://id.ndl.go.jp/bib/000008580754
LC Control Number: 2006920295
https://lccn.loc.gov/2006920295
OCLC No.: 70663400
https://www.worldcat.org/oclc/70663400
Bibliographic Record Category (NDL): 215