Hot-carrier effects in MOS devices / Eiji Takeda, Cary Y. Yang, Akemi Miura-Hamada.

• Material Type: 図書
• ISBN: 0126822409 (acid-free paper); 9780126822403 (acid-free paper)
• Title: Hot-carrier effects in MOS devices / Eiji Takeda, Cary Y. Yang, Akemi Miura-Hamada.
• Author Heading: 武田, 英次, 1949- タケダ, エイジ, 1949- ( 00176889 )Authorities; Yang, C. Y.-W. (Cary Y.-W.) , 1948-; Miura-Hamada, Akemi.
• Publication, Distribution, etc.: San Diego : Academic Press
• Publication Date: c1995.
• Publication Date (W3CDTF): 1995
• Extent: xii, 312 p. : ill. ; 24 cm.
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Metal oxide semiconductors.; Hot carriers.; Semiconductors -- Quantum theory.
• LCC: TK7871.99.M44
• DDC: 537.6/225
• NDLC: ND371
• Note (General): Related URL: Publisher description http: //www.loc.gov/catdir/description/els032/95030713.html.; Related URL: Table of contents http: //www.loc.gov/catdir/toc/els032/95030713.html.
• Note (Bibliography): Includes bibliographical references (p. 187-301) and index.
• Holding library: 国立国会図書館
• Call No.: ND371-B26
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000009113793; http://id.ndl.go.jp/bib/000009113793
• LC Control Number: 95030713; https://lccn.loc.gov/95030713
• OCLC No.: 32738829; https://www.worldcat.org/oclc/32738829
• Cataloging Rule: Anglo-American Cataloging Rules
• Bibliographic Record Category (NDL): 211