ISTFA 2007 : proceedings of the 33rd international symposium for testing and failure analysis : November 4-8, 2007 : San Jose McEnery Convention Center : San Jose, California, USA. : Nov 2007, San Jose, CA.

• Material Type: 図書
• ISBN: 0871708639; 9780871708632 (ISBN-13)
• Title: ISTFA 2007 : proceedings of the 33rd international symposium for testing and failure analysis : November 4-8, 2007 : San Jose McEnery Convention Center : San Jose, California, USA. : Nov 2007, San Jose, CA.
• Author Heading: International Symposium for Testing and Failure Analysis (33rd : 2007 : San Jose, Calif.)
• Publication, Distribution, etc.: Materials Park : ASM International
• Publication Date: c2007.
• Publication Date (W3CDTF): 2007
• Extent: xvi, 356 p. : ill. : 28 cm.
• Accompanying material: With a CD-ROM.
• Alternative Title: ISTFA 2007 : November 4-8, 2007 : conference proceedings from the 33rd international symposium for testing and failure analysis
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Electronics -- Materials -- Testing -- Congresses.; Electronic apparatus and appliances -- Testing -- Congresses.
• NDLC: M17
• Note (General): Papers.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-08-251
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000009218322; http://id.ndl.go.jp/bib/000009218322
• OCLC No.: 182765356; https://www.worldcat.org/oclc/182765356
• Bibliographic Record Category (NDL): 215