高精度密度測定による半導体融体の局所構造変化と濃度揺らぎの研究

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Material Type: 図書
Title: 高精度密度測定による半導体融体の局所構造変化と濃度揺らぎの研究
Title Transcription: コウセイドミツドソクテイニヨルハンドウタイユウタイノキョクショコウゾウヘンカトノウドユラギノケンキュウ
Author/Editor: 土屋良海, 新潟大学 [著]
Author Heading: 土屋, 良海ツチヤ, ヨシミ
新潟大学ニイガタダイガク
Publication, Distribution, etc.: [土屋良海]
Publication Date: 2004-2006
2007.3
Publication Date (W3CDTF): 2004
2006
Extent: 2, 50p
Additional Title: 研究種目基盤研究(C)
Place of Publication (Country Code): JP
Text Language Code: jpn
eng
Subject Heading: Ge-Te molten alloy / Liquid-liquid transition / Specific heat / Sound velocity Ge-Te molten alloy / Liquid-liquid transition / Specific heat / Sound velocity
NDLC: Y151
Note (General): 文部科学省科学研究費補助金研究成果報告書
Research Project No. of Grants-in-Aid for Scientific Research: 16560577
Holding library: 国立国会図書館
Call No.: Y151-H16560577
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000009288979
http://id.ndl.go.jp/bib/000009288979
Bibliographic Record Category (NDL): 214