Gate stack scaling: materials, role of interfaces and reliability implications : April 17-21, 2006 : San Francisco, California, USA. : Apr 2006, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 917)

Gate stack scaling: materials, role of interfaces and reliability implications : April 17-21, 2006 : San Francisco, California, USA. : Apr 2006, San Francisco, CA.

(Materials Research Society Symposia Proceedings ; 917)

Call No. (NDL): M17-08-1533
Bibliographic ID of National Diet Library: 000009413495

Material type: 図書

Author: Materials Research Society. Meeting (2006 : San Francisco, Calif.)

Publisher: Materials Research Society

Publication date: c2006.

Material Format: Paper

Capacity, size, etc.: 192 p. : ill. ; 24 cm.

NDC: -

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Notes on use

Note (General)：: Papers."Spring 2006" -- on cover.

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Paper

Material Type: 図書
ISBN: 9781558998742
Title: Gate stack scaling: materials, role of interfaces and reliability implications : April 17-21, 2006 : San Francisco, California, USA. : Apr 2006, San Francisco, CA.
Series Title: Materials Research Society Symposia Proceedings ; 917
Title Heading: Materials Research Society symposia proceedings ; v. 917.
Author Heading: Materials Research Society. Meeting (2006 : San Francisco, Calif.)
Publication, Distribution, etc.: Warrendale : Materials Research Society
Publication Date: c2006.
Publication Date (W3CDTF): 2006
Extent: 192 p. : ill. ; 24 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Ultra large scale integration -- Materials -- Congresses.
Metal oxide semiconductors, Complementary -- Congresses.
Metal oxide semiconductor field-effect transistors -- Congresses.
Gate array circuits -- Congresses.
Dielectrics -- Congresses.
Electric leakage -- Congresses.
NDLC: M17
Note (General): Papers.
"Spring 2006" -- on cover.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-08-1533
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000009413495
http://id.ndl.go.jp/bib/000009413495
OCLC No.: 150548103
https://www.worldcat.org/oclc/150548103
Bibliographic Record Category (NDL): 215