図書

Twenty-third annual IEEE semiconductor thermal measurement and management symposium : San Jose, CA : March 20-22, 2007. : 23rd semiconductor thermal measurement, modeling, and management symposium : SEMI-THERM conference : SEMI-THERM 23 : ST23 : Mar 2007, San Jose, CA.

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Twenty-third annual IEEE semiconductor thermal measurement and management symposium : San Jose, CA : March 20-22, 2007. : 23rd semiconductor thermal measurement, modeling, and management symposium : SEMI-THERM conference : SEMI-THERM 23 : ST23 : Mar 2007, San Jose, CA.

Call No. (NDL)
M17-08-2292
Bibliographic ID of National Diet Library
000009557289
Material type
図書
Author
-
Publisher
IEEE
Publication date
c2007.
Material Format
Paper
Capacity, size, etc.
ix, 261, 2 p. : ill. ; 28 cm.
NDC
-
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Note (General)：

Papers.IEEE cat no 07CH37872 (softbound ed.) , 07CH37872C (CD-ROM ed.) .

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Paper

Material Type
図書
ISBN
1424409586
ISBN (error code)
424409586
424409594
ISSN
1065-2221
Title
Twenty-third annual IEEE semiconductor thermal measurement and management symposium : San Jose, CA : March 20-22, 2007. : 23rd semiconductor thermal measurement, modeling, and management symposium : SEMI-THERM conference : SEMI-THERM 23 : ST23 : Mar 2007, San Jose, CA.
Publication, Distribution, etc.
Piscataway : IEEE
Publication Date
c2007.
Publication Date (W3CDTF)
2007
Extent
ix, 261, 2 p. : ill. ; 28 cm.
Alternative Title
23rd annual IEEE semiconductor thermal measurement and management symposium : San Jose, CA : March 20-22, 2007