Proceedings of 2008 international conference on condition monitoring and diagnosis : Beijing, China April 21-24, 2008. : CMD2008 : Apr 2008, Beijing, China.

Author: Hua bei dian li da xue. Beijing Area Major Laboratory of High Voltage and EMC.

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Note (General)：: Papers."CMD 2008 is the second biennial conference (...) " -- forward.IEEE cat no CFP0830D-PRT.

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Material Type: 図書
ISBN (set): 9781424416219 (set)
Title: Proceedings of 2008 international conference on condition monitoring and diagnosis : Beijing, China April 21-24, 2008. : CMD2008 : Apr 2008, Beijing, China.
Author Heading: Hua bei dian li da xue. Beijing Area Major Laboratory of High Voltage and EMC.
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: [c2008]
Publication Date (W3CDTF): 2008
Extent: 2 v. : ill. ; 30 cm.
Alternative Title: CMD 2008
Place of Publication (Country Code): US
NDLC: M17
Note (General): Papers.
"CMD 2008 is the second biennial conference (...) " -- forward.
IEEE cat no CFP0830D-PRT.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-08-2268
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000009720245
http://id.ndl.go.jp/bib/000009720245
Bibliographic Record Category (NDL): 215