ETS 2008 : thirteenth IEEE European test symposium : proceedings : 25-29 May 2008 : Verbania, Italy. : TTTC-sponsored technical meetings : May 2008, Verbania, Italy.

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Note (General)：: Abstracts and selected papers.IEEE cat no P3150 (t.p. verso) , CFP08216-PRT (cover) .

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Material Type: 図書
ISBN: 9780769531502
ISSN: 1530-1877
Title: ETS 2008 : thirteenth IEEE European test symposium : proceedings : 25-29 May 2008 : Verbania, Italy. : TTTC-sponsored technical meetings : May 2008, Verbania, Italy.
Author Heading: IEEE European Test Symposium (13th : 2008 : Verbania, Italy)
Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
Publication Date: c2008.
Publication Date (W3CDTF): 2008
Extent: xvii, 205 p. : ill. ; 28 cm.
Alternative Title: ETS 2008 : 13th IEEE European test symposium : proceedings : 25-29 May 2008 : Verbania, Italy
13th European test symposium : (ETS 2008) : 25-29 May 2008 : Verbania, Italy
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Testing -- Congresses.
NDLC: M17
Note (General): Abstracts and selected papers.
IEEE cat no P3150 (t.p. verso) , CFP08216-PRT (cover) .
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-09-727
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000009978166
http://id.ndl.go.jp/bib/000009978166
OCLC No.: 259749980
https://www.worldcat.org/oclc/259749980
Bibliographic Record Category (NDL): 215