Proceedings of the 16th Asian test symposium : 8-11 October 2007, Beijing, China. : Oct 2007, Beijing, China.

Call No. (NDL): M17-09-1407
Bibliographic ID of National Diet Library: 000010075571

Material type: 図書

Author: Asian Test Symposium (16th : 2007 : Beijing, China)

Publisher: IEEE Computer Society

Publication date: c2007.

Material Format: Paper

Capacity, size, etc.: xxiv, 528 p. : ill. ; 28 cm.

NDC: -

View All

Notes on use

Note (General)：: Abstracts and papers." (...) (ATS '07) , the sixteenth in a series of annual symposia (...) " -- foreword."Two half-day tutorials are offered by (...)...

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type: 図書
ISBN: 0769528902
9780769528908 (ISBN-13)
ISSN: 1081-7735
Title: Proceedings of the 16th Asian test symposium : 8-11 October 2007, Beijing, China. : Oct 2007, Beijing, China.
Author Heading: Asian Test Symposium (16th : 2007 : Beijing, China)
Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
Publication Date: c2007.
Publication Date (W3CDTF): 2007
Extent: xxiv, 528 p. : ill. ; 28 cm.
Alternative Title: 16th IEEE Asian test symposium : (ATS 2007) : Beijing, P.R. China : 09-11 October 2007
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Electronic digital computers -- Circuits -- Testing -- Congresses.
Electronic circuits -- Testing -- Congresses.
Fault-tolerant computing -- Congresses.
NDLC: M17
Note (General): Abstracts and papers.
" (...) (ATS '07) , the sixteenth in a series of annual symposia (...) " -- foreword.
"Two half-day tutorials are offered by (...) " -- foreword.
IEEE cat no P2890 (t.p. verso) , PR2890 (cover & spine) .
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-09-1407
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000010075571
http://id.ndl.go.jp/bib/000010075571
OCLC No.: 231846045
https://www.worldcat.org/oclc/231846045
Bibliographic Record Category (NDL): 215