図書

Instrumentation, metrology, and standards for nanomanufacturing 3 : 3-5 August 2009 : San Diego, California, United States. : 2009 SPIE conference, instrumentation, metrology, and standards for nanomanufacturing 3 : Aug 2009, San Diego, CA. (SPIE Proceedings ; 7405)

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Instrumentation, metrology, and standards for nanomanufacturing 3 : 3-5 August 2009 : San Diego, California, United States. : 2009 SPIE conference, instrumentation, metrology, and standards for nanomanufacturing 3 : Aug 2009, San Diego, CA.

(SPIE Proceedings ; 7405)

Call No. (NDL)
M17-10-1136
Bibliographic ID of National Diet Library
000010593267
Material type
図書
Author
Postek, Michael T.ほか
Publisher
SPIE
Publication date
c2009.
Material Format
Paper
Capacity, size, etc.
1 v. (various pagings) : ill. ; 28 cm.
NDC
-
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Paper

Material Type
図書
ISBN
9780819476951
ISSN (series)
0277-786X
Title
Instrumentation, metrology, and standards for nanomanufacturing 3 : 3-5 August 2009 : San Diego, California, United States. : 2009 SPIE conference, instrumentation, metrology, and standards for nanomanufacturing 3 : Aug 2009, San Diego, CA.
Series Title
SPIE Proceedings ; 7405
Title Heading
Proceedings of SPIE -- the International Society for Optical Engineering ; v. 7405.
Author Heading
Postek, Michael T.
Allgair, John A. (John Alexander)
Publication, Distribution, etc.
Bellingham : SPIE
Publication Date
c2009.
Publication Date (W3CDTF)
2009