Scanning microscopy 2010 : 17-19 May 2010 : Monterey, California, United States. : 2nd of the SPIE scanning microscopy symposia : scanning microscopy 2010 meeting : May 2010, Monterey, CA. (SPIE Proceedings ; 7729)

Scanning microscopy 2010 : 17-19 May 2010 : Monterey, California, United States. : 2nd of the SPIE scanning microscopy symposia : scanning microscopy 2010 meeting : May 2010, Monterey, CA.

(SPIE Proceedings ; 7729)

Call No. (NDL): M17-10-4242
Bibliographic ID of National Diet Library: 000010986956

Material type: 図書

Author: Postek, Michael T.

Publisher: SPIE

Publication date: c2010.

Material Format: Paper

Capacity, size, etc.: 1 v. (various pagings) : ill. ; 28 cm.

NDC: -

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Note (General)：: Papers.

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Paper

Material Type: 図書
ISBN: 9780819482174
ISSN (series): 0277-786X
Title: Scanning microscopy 2010 : 17-19 May 2010 : Monterey, California, United States. : 2nd of the SPIE scanning microscopy symposia : scanning microscopy 2010 meeting : May 2010, Monterey, CA.
Series Title: SPIE Proceedings ; 7729
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering, 0277-786X ; v. 7729.
Author Heading: Postek, Michael T.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2010.
Publication Date (W3CDTF): 2010
Extent: 1 v. (various pagings) : ill. ; 28 cm.
Alternative Title: SPIE scanning microscopy
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Scanning electron microscopes -- Congresses.
LCC: QH212.S3
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-10-4242
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000010986956
http://id.ndl.go.jp/bib/000010986956
OCLC No.: 656784720
https://www.worldcat.org/oclc/656784720
Bibliographic Record Category (NDL): 215