2009 IEEE international workshop on memory technology, design and testing : (MTDT 2009) : Hsinchu, Taiwan : 31 August-2 September 2009. : MTDT2009 : Aug 2009, Hsinchu, Taiwan.

Author: IEEE International Workshop on Memory Technology, Design, and Testing (17th : 2009 : Hsin-chu shih, Taiwan)

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Material Type: 図書
ISBN: 9781424451852
Title: 2009 IEEE international workshop on memory technology, design and testing : (MTDT 2009) : Hsinchu, Taiwan : 31 August-2 September 2009. : MTDT2009 : Aug 2009, Hsinchu, Taiwan.
Author Heading: IEEE International Workshop on Memory Technology, Design, and Testing (17th : 2009 : Hsin-chu shih, Taiwan)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2009.
Publication Date (W3CDTF): 2009
Extent: 93 p. : ill. ; 28 cm.
Alternative Title: 2009 IEEE international workshop on memory technology, design, and testing : (MTDT 2009) : Hsinchu, Taiwan : 31 August 02 September 2009
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Semiconductor storage devices -- Testing -- Congresses.
Random access memory -- Congresses.
LCC: TK7895.M4
NDLC: M17
Note (General): Abstracts and papers.
IEEE cat no CFP09028-PRT.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-11-564
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000011008804
http://id.ndl.go.jp/bib/000011008804
OCLC No.: 501813714
https://www.worldcat.org/oclc/501813714
Bibliographic Record Category (NDL): 215