2010 17th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2010) : Singapore : 5-9 July 2010 : Jul 2010, Singapore.

• Material Type: 図書
• ISBN: 9781424455966
• ISSN: 19461542
• Title: 2010 17th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2010) : Singapore : 5-9 July 2010 : Jul 2010, Singapore.
• Author Heading: International Symposium on the Physical & Failure Analysis of Integrated Circuits (17th : 2010 : Singapore); IEEE Reliability/CPMT/ED Singapore Chapter.
• Publication, Distribution, etc.: Piscataway : IEEE
• Publication Date: c2010.
• Publication Date (W3CDTF): 2010
• Extent: 364 p.
• Other physical details: ill.
• Size: 27 cm.
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Integrated circuits--Reliability--Congresses.; Integrated circuits--Testing--Congresses.; Semiconductors--Failures--Congresses.; Integrated circuits--Defects--Congresses.
• LCC: TK7874
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers.; IEEE cat no CFP10777-PRT.
• Note (Bibliography): Includes bibliographical references and author index.
• Source: IEEE Xplore; http://ieeexplore.ieee.org/servlet/opac?punumber=5519247
• Holding library: 国立国会図書館
• Call No.: M17-12-238
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000011245807; http://id.ndl.go.jp/bib/000011245807
• OCLC No.: 701255522; https://www.worldcat.org/oclc/701255522
• Cataloging Rule: Anglo-American Cataloging Rules
• Bibliographic Record Category (NDL): 215