IEEE symposium on visual analytics science and technology 2008 : proceedings : Columbus, Ohio USA : October 21-23, 2008 : held co-jointly with VisWeek 2008, October 19-24 : VAST symposium : VAST08 : Oct 2008, Columbus, OH.

• Material Type: 図書
• ISBN: 9781424429356
• Title: IEEE symposium on visual analytics science and technology 2008 : proceedings : Columbus, Ohio USA : October 21-23, 2008 : held co-jointly with VisWeek 2008, October 19-24 : VAST symposium : VAST08 : Oct 2008, Columbus, OH.
• Author Heading: IEEE Symposium on Visual Analytics Science and Technology (2008 : Columbus, Ohio); Ebert, David.; Ertl, Thomas, 1957-
• Publication, Distribution, etc.: Piscataway : IEEE
• Publication Date: c2008.
• Publication Date (W3CDTF): 2008
• Extent: 216 p.
• Other physical details: ill.
• Size: 27 cm.
• Additional Title: IEEE symposium on visual analytics science and technology 2008 : Columbus, Ohio, USA : October 19-24, 2008.
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Digital computer simulation--Congresses.; Visual analytics--Congresses.; Information visualization--Congresses.; Computer graphics--Congresses.
• LCC: QA76.9.C65
• DDC: 006.6
• NDLC: M17
• Target Audience: 一般
• Note (General): An abstract and papers.; "In its third year, the VAST Symposium had (...)" -- pref.; IEEE cat no CFP08VAS-PRT.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-12-222
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000011246577; http://id.ndl.go.jp/bib/000011246577
• LC Control Number: 2009417579; https://lccn.loc.gov/2009417579
• Cataloging Rule: Anglo-American Cataloging Rules
• Bibliographic Record Category (NDL): 215