International conference on extended defects in semiconductors 2010 : (EDS 2010) : Brighton, United Kingdom : 19-24 September 2010 : biennial international conference on extended defects in semiconductors : EDS2010 : EDS 15 : Sep 2010, Brighton, UK. (Journal of Physics: Conference Series ; 281)

International conference on extended defects in semiconductors 2010 : (EDS 2010) : Brighton, United Kingdom : 19-24 September 2010 : biennial international conference on extended defects in semiconductors : EDS2010 : EDS 15 : Sep 2010, Brighton, UK.

(Journal of Physics: Conference Series ; 281)

Call No. (NDL): M17-12-313
Bibliographic ID of National Diet Library: 000011254262

Material type: 図書

Author: International Conference on Extended Defects in Semiconductors (2010 : Sussex University)

Publisher: Institute of Physics

Publication date: c2010.

Material Format: Paper

Capacity, size, etc.: 234 p. ; 27 cm.

NDC: -

View All

Notes on use

Note (General)：: Papers.

Other physical details：: ill.

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type: 図書
ISBN: 9781617827655
ISSN: 17426596
ISSN (series): 17426588
Title: International conference on extended defects in semiconductors 2010 : (EDS 2010) : Brighton, United Kingdom : 19-24 September 2010 : biennial international conference on extended defects in semiconductors : EDS2010 : EDS 15 : Sep 2010, Brighton, UK.
Series Title: Journal of Physics: Conference Series ; 281
Title Heading: Journal of physics. Conference series ; v. 281.
Author Heading: International Conference on Extended Defects in Semiconductors (2010 : Sussex University)
Publication, Distribution, etc.: Bristol : Institute of Physics
Publication Date: c2010.
Publication Date (W3CDTF): 2010
Extent: 234 p.
Other physical details: ill.
Size: 27 cm.
Place of Publication (Country Code): GB
Text Language Code: eng
Genre/Form Terms: Electronic books.
Conference proceedings.
Subject Heading: Semiconductors--Defects--Congresses.
NDLC: M17
Target Audience: 一般
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Source: Freely available online
http://iopscience.iop.org/1742-6596/281/1
Holding library: 国立国会図書館
Call No.: M17-12-313
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000011254262
http://id.ndl.go.jp/bib/000011254262
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215