2010 proceedings -- annual reliability and maintainability symposium : (RAMS 2010) : San Jose, California, USA : 25-28 January 2010 : international symposium on product quality & integrity : Jan 2010, San Jose, CA.

• Material Type: 図書
• ISBN: 9781424451029
• ISSN: 0149144X
• Title: 2010 proceedings -- annual reliability and maintainability symposium : (RAMS 2010) : San Jose, California, USA : 25-28 January 2010 : international symposium on product quality & integrity : Jan 2010, San Jose, CA.
• Author Heading: Reliability and Maintainability Symposium (2010 : San Jose, Calif.); International Symposium on Product Quality and Integrity (2010 : San Jose, Calif.)
• Publication, Distribution, etc.: Piscataway : IEEE
• Publication Date: c2010.
• Publication Date (W3CDTF): 2010
• Extent: 554 p.
• Other physical details: ill.
• Size: 28 cm.
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Reliability (Engineering)--Congresses.; Maintainability (Engineering)--Congresses.
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers.; "RAMS marks its 56th year in San Jose, California." -- next page of page numbers.; IEEE cat no CFP10RAM-PRT.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-12-356
• Has Format: Available online; http://ieeexplore.ieee.org/servlet/opac?punumber=5443868
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000011255348; http://id.ndl.go.jp/bib/000011255348
• OCLC No.: 698244701; https://www.worldcat.org/oclc/698244701
• Cataloging Rule: Anglo-American Cataloging Rules
• Bibliographic Record Category (NDL): 215