2010 19th IEEE Asian test symposium : (ATS 2010) : Shanghai, China : 1-4 December 2010 : Dec 2010, Shanghai, China.

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Material Type: 図書
ISBN: 9781424488414
ISSN: 10817735
Title: 2010 19th IEEE Asian test symposium : (ATS 2010) : Shanghai, China : 1-4 December 2010 : Dec 2010, Shanghai, China.
Author Heading: Asian Test Symposium (19th : 2010 : Shanghai, China)
Shanghai University.
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2010.
Publication Date (W3CDTF): 2010
Extent: xviii, 463 p.
Other physical details: ill.
Size: 27 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Electronic digital computers--Circuits--Testing--Congresses.
Electronic circuits--Testing--Congresses.
Fault-tolerant computing--Congresses.
LCC: TK7888.4
NDLC: M17
Target Audience: 一般
Note (General): Papers.
IEEE cat no CFP10067-PRT.
Note (Bibliography): Includes bibliographical references and author index.
Source: http://ieeexplore.ieee.org/servlet/opac?punumber=5689827
Holding library: 国立国会図書館
Call No.: M17-12-765
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000011270027
http://id.ndl.go.jp/bib/000011270027
OCLC No.: 759445229
https://www.worldcat.org/oclc/759445229
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215