Atomic force microscopy based nanorobotics : modelling, simulation, setup building and experiments

• Material Type: 図書
• ISBN: 9783642203282; 3642203280
• ISSN (series): 1610-7438
• Title: Atomic force microscopy based nanorobotics : modelling, simulation, setup building and experiments
• Author/Editor: Hui Xie ... [et al.].
• Series Title: Springer tracts in advanced robotics ; v. 71
• Title Heading: Springer tracts in advanced robotics ; 71.
• Author Heading: Xie, Hui.
• Publication, Distribution, etc.: Berlin : Springer
• Publication Date: c2011.
• Publication Date (W3CDTF): 2011
• Extent: xiv, 342 p.
• Other physical details: ill. (some col.)
• Size: 24 cm.
• Place of Publication (Country Code): DE
• Text Language Code: eng
• Subject Heading: Microrobots.; Atomic force microscopy.; Micrurgy.; Nanotechnology.; Robotics.; Kraftmikroskopie.; Mikromanipulator.; Nanotechnologie.
• LCC: TJ211.36
• DDC: 620.50150282
• NDLC: ND448
• Target Audience: 一般
• Note (Bibliography): Includes bibliographical references and index.
• Publisher No.: Best.-Nr.: 12841448
• Holding library: 国立国会図書館
• Call No.: ND448-B13
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 023427534; http://id.ndl.go.jp/bib/023427534
• LC Control Number: 2011934157; https://lccn.loc.gov/2011934157
• OCLC No.: 731918654; https://www.worldcat.org/oclc/731918654
• Bibliographic Record Category (NDL): 211

• Contents: Introduction1. Descriptions and Challenges of AFM Based Nanorobotic Systems2. Instrumentation Issues of an AFM Based Nanorobotic System...
• Summary, etc.: The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, n...