Frontiers of characterization and metrology for nanoelectronics: 2011 : Grenoble, France 23-26 May 2011 : 2011 international conference on frontiers of characterization and metrology for nanoelectronics (2011 FCMN) : May 2011, Grenoble, France. (AIP Conference Proceedings ; 1395)

Frontiers of characterization and metrology for nanoelectronics: 2011 : Grenoble, France 23-26 May 2011 : 2011 international conference on frontiers of characterization and metrology for nanoelectronics (2011 FCMN) : May 2011, Grenoble, France.

(AIP Conference Proceedings ; 1395)

Call No. (NDL): M17-12-3709
Bibliographic ID of National Diet Library: 023631549

Material type: 図書

Author: International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (8th : 2011 : Grenoble, France)ほか

Publisher: American Institute of Physics

Publication date: 2011.

Material Format: Paper

Capacity, size, etc.: xi, 377 p. ; 29 cm

NDC: -

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Notes on use

Note (General)：: Papers."The 2011 FCMN was the eighth in a series that began in 1995 (...)" -- pref.

Other physical details：: ill. (some col.)

Accompanying material：: 1 CD-ROM (4 3/4 in.).

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Paper

Material Type: 図書
ISBN: 9780735409651
9780735409736 (CD-ROM)
0735409730
ISSN (series): 0094243X
Title: Frontiers of characterization and metrology for nanoelectronics: 2011 : Grenoble, France 23-26 May 2011 : 2011 international conference on frontiers of characterization and metrology for nanoelectronics (2011 FCMN) : May 2011, Grenoble, France.
Series Title: AIP Conference Proceedings ; 1395
Title Heading: AIP conference proceedings ; no. 1395.
Author Heading: International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (8th : 2011 : Grenoble, France)
Seiler, David G.
Publication, Distribution, etc.: Melville : American Institute of Physics
Publication Date: 2011.
Publication Date (W3CDTF): 2011
Extent: xi, 377 p.
Other physical details: ill. (some col.)
Size: 29 cm
Accompanying material: 1 CD-ROM (4 3/4 in.).
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Nanoelectronics--Congresses.
Semiconductors--Characterization--Congresses.
Semiconductors--Measurement--Congresses.
LCC: TK7874.84
TK7874.76
NDLC: M17
Target Audience: 一般
Note (General): Papers.
"The 2011 FCMN was the eighth in a series that began in 1995 (...)" -- pref.
Note (Bibliography): Includes bibliographical references and indexes.
Holding library: 国立国会図書館
Call No.: M17-12-3709
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 023631549
http://id.ndl.go.jp/bib/023631549
LC Control Number: 2011936790
https://lccn.loc.gov/2011936790
OCLC No.: 764382816
https://www.worldcat.org/oclc/764382816
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215