2012 IEEE international conference on microelectronic test structures : (ICMTS 2012) : San Diego, California, USA : 19-22 March 2012 : Mar 2012, San Diego, CA.

Author: IEEE International Conference on Microelectronic Test Structures (2012 : San Diego, Calif.)

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Material Type: 図書
ISBN: 9781467310277
ISSN: 10719032
Title: 2012 IEEE international conference on microelectronic test structures : (ICMTS 2012) : San Diego, California, USA : 19-22 March 2012 : Mar 2012, San Diego, CA.
Author Heading: IEEE International Conference on Microelectronic Test Structures (2012 : San Diego, Calif.)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2012.
Publication Date (W3CDTF): 2012
Extent: 256 p.
Other physical details: ill.
Size: 27 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits--Testing--Congresses.
Semiconductors--Testing--Congresses.
Electronic apparatus and appliances--Testing--Congresses.
LCC: TK7874
NDLC: M17
Target Audience: 一般
Note (General): Program and papers.
IEEE cat no CFP12MTS-PRT.
Note (Bibliography): Includes bibliographical references.
Source: http://ieeexplore.ieee.org/servlet/opac?punumber=6182735
Holding library: 国立国会図書館
Call No.: M17-12-3881
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 023748134
http://id.ndl.go.jp/bib/023748134
OCLC No.: 793802889
https://www.worldcat.org/oclc/793802889
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215