2012 28th annual IEEE semiconductor thermal measurement and management symposium : (SEMI-THERM 2012) : San Jose, California, USA : 18-22 March 2012 : 28th annual IEEE thermal measurement, modeling and management symposium : ST28 : SEMI-THERM 28 vendor workshop : Mar 2012, San Jose, CA.

2012 28th annual IEEE semiconductor thermal measurement and management symposium : (SEMI-THERM 2012) : San Jose, California, USA : 18-22 March 2012 : 28th annual IEEE thermal measurement, modeling and management symposium : ST28 : SEMI-THERM 28 vendor workshop : Mar 2012, San Jose, CA.

Call No. (NDL): M17-12-4129
Bibliographic ID of National Diet Library: 023796376

Material type: 図書

Author: IEEE Semiconductor Thermal Measurement and Management Symposium (28th : 2012 : San Jose, Calif.)

Publisher: IEEE

Publication date: c2012.

Material Format: Paper

Capacity, size, etc.: 367 p. ; 27 cm.

NDC: -

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Notes on use

Note (General)：: Abstracts and papers."For the auxiliary program, there are: Six short courses, include topics (...)" -- welcome to IEEE SEMI-THERM 28.IEEE cat no CFP1...

Other physical details：: ill.

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Paper

Material Type: 図書
ISBN: 9781467311106
ISSN: 10652221
Title: 2012 28th annual IEEE semiconductor thermal measurement and management symposium : (SEMI-THERM 2012) : San Jose, California, USA : 18-22 March 2012 : 28th annual IEEE thermal measurement, modeling and management symposium : ST28 : SEMI-THERM 28 vendor workshop : Mar 2012, San Jose, CA.
Author Heading: IEEE Semiconductor Thermal Measurement and Management Symposium (28th : 2012 : San Jose, Calif.)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2012.
Publication Date (W3CDTF): 2012
Extent: 367 p.
Other physical details: ill.
Size: 27 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Semiconductors--Thermal properties--Congresses.
Semiconductors--Cooling--Congresses.
LCC: TK7871.85
NDLC: M17
Target Audience: 一般
Note (General): Abstracts and papers.
"For the auxiliary program, there are: Six short courses, include topics (...)" -- welcome to IEEE SEMI-THERM 28.
IEEE cat no CFP12SEM-PRT.
Note (Bibliography): Includes bibliographical references.
Source: IEEE Xplore
http://ieeexplore.ieee.org/servlet/opac?punumber=6182937
Holding library: 国立国会図書館
Call No.: M17-12-4129
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 023796376
http://id.ndl.go.jp/bib/023796376
OCLC No.: 793394199
https://www.worldcat.org/oclc/793394199
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215