Scanning microscopies 2012: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 24-26 April 2012 : Baltimore, Maryland, United States : scanning microscopies 2012: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences (conference 8378) : DSS meeting : 2012 SPIE defense security+sensing symposium : Apr 2012, Baltimore, MD. (SPIE Proceedings ; 8378)

Scanning microscopies 2012: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 24-26 April 2012 : Baltimore, Maryland, United States : scanning microscopies 2012: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences (conference 8378) : DSS meeting : 2012 SPIE defense security+sensing symposium : Apr 2012, Baltimore, MD.

(SPIE Proceedings ; 8378)

Call No. (NDL): M17-12-3978
Bibliographic ID of National Diet Library: 023806383

Material type: 図書

Author: Postek, Michael T.

Publisher: SPIE

Publication date: c2012.

Material Format: Paper

Capacity, size, etc.: 1 v. (various pagings) ; 28 cm.

NDC: -

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Notes on use

Note (General)：: Papers.

Other physical details：: ill.

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Paper

Material Type: 図書
ISBN: 9780819490568
ISSN (series): 0277786X
Title: Scanning microscopies 2012: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 24-26 April 2012 : Baltimore, Maryland, United States : scanning microscopies 2012: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences (conference 8378) : DSS meeting : 2012 SPIE defense security+sensing symposium : Apr 2012, Baltimore, MD.
Series Title: SPIE Proceedings ; 8378
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 8378. 0277-786X
Author Heading: Postek, Michael T.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2012.
Publication Date (W3CDTF): 2012
Extent: 1 v. (various pagings)
Other physical details: ill.
Size: 28 cm.
Additional Title: SPIE defense, security + sensing.
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Electronic books.
Subject Heading: Scanning electron microscopes--Congresses.
LCC: QH212.S3
NDLC: M17
Target Audience: 一般
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Source: http://link.spie.org/PSISDG/8378/1
Holding library: 国立国会図書館
Call No.: M17-12-3978
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 023806383
http://id.ndl.go.jp/bib/023806383
OCLC No.: 795237147
https://www.worldcat.org/oclc/795237147
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215