博士論文

Hot-carrier effects in nanoscale MOSFETs : generation behavior of interface traps

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Hot-carrier effects in nanoscale MOSFETs : generation behavior of interface traps

Call No. (NDL)
UT51-2012-R385
Bibliographic ID of National Diet Library
024457746
Material type
博士論文
Author
Ming Hu [著]
Publisher
[Ming Hu]
Publication date
[2012]
Material Format
Paper
Capacity, size, etc.
1冊
Name of awarding university/degree
島根大学,博士(工学)
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Paper

Material Type
博士論文
Title
Hot-carrier effects in nanoscale MOSFETs : generation behavior of interface traps
Author/Editor
Ming Hu [著]
Author Heading
胡, 明 フー, ミン
Publication, Distribution, etc.
[Ming Hu]
Publication Date
[2012]
Publication Date (W3CDTF)
2012
Extent
1冊
Alternative Title
ナノスケールMOSFETにおけるホットキャリア効果 : 界面トラップの発生振舞い ナノスケール MOSFET ニ オケル ホット キャリア コウカ : カイメン トラップ ノ ハッセイ フルマイ
Degree grantor/type
島根大学