2012 IEEE international integrated reliability workshop final report : (IIRW 2012) : South Lake Tahoe, California, USA : 14-18 October 2012 : Oct 2012, South Lake Tahoe, CA.

• Material Type: 図書
• ISBN: 9781467327497
• ISSN: 19308841
• Title: 2012 IEEE international integrated reliability workshop final report : (IIRW 2012) : South Lake Tahoe, California, USA : 14-18 October 2012 : Oct 2012, South Lake Tahoe, CA.
• Author Heading: International Integrated Reliability Workshop (2012 : South Lake Tahoe, Calif.)
• Publication, Distribution, etc.: Piscataway : IEEE
• Publication Date: c2012.
• Publication Date (W3CDTF): 2012
• Extent: ix, 239 p.
• Other physical details: ill.
• Size: 27 cm.
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Semiconductors--Reliability--Congresses.; Integrated circuits--Wafer-scale integration--Reliability--Congresses.; Integrated circuits--Reliability--Congresses.
• LCC: TK7874
• NDLC: M17
• Target Audience: 一般
• Note (General): Abstracts, papers and a presentation.; IEEE cat no CFP12IRW-PRT.
• Note (Bibliography): Includes bibliographical references.
• Source: Full text available from IEEE/IET Electronic Library (IEL) Proceedings By Volume （Connect to full text.）; http://encompass.library.cornell.edu/cgi-bin/checkIP.cgi?access=gateway_standard%26url=http://ieeexplore.ieee.org/servlet/opac?punumber=6457539; IEEE Xplore; http://ieeexplore.ieee.org/servlet/opac?punumber=6457539
• Holding library: 国立国会図書館
• Call No.: M17-13-3207
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 024633322; http://id.ndl.go.jp/bib/024633322
• OCLC No.: 839274891; https://www.worldcat.org/oclc/839274891
• Cataloging Rule: Anglo-American Cataloging Rules
• Bibliographic Record Category (NDL): 215