Development of a direct measurement method of magnetostriction constant of actual magnetic devices and wafers by applying inverse-magnetostriction effect

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Material Type: 博士論文
Title: Development of a direct measurement method of magnetostriction constant of actual magnetic devices and wafers by applying inverse-magnetostriction effect
Author/Editor: Kazuhiko Okita [著]
Author Heading: 沖田, 和彦オキタ, カズヒコ
Publication, Distribution, etc.: [Kazuhiko Okita]
Publication Date: [2013]
Publication Date (W3CDTF): 2013
Extent: 1冊
Alternative Title: 逆磁歪効果を応用した磁気デバイスと磁性基板の磁歪定数直接測定法の開発ギャクジワイコウカオオウヨウシタジキデバイストジセイキバンノジワイテイスウチョクセツソクテイホウノカイハツ
Degree grantor/type: 東北大学
Date Granted: 平成25年3月27日
Date Granted (W3CDTF): 2013
Dissertation Number: 甲第15179号
Degree Type: 博士(工学)
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
Text Language Code: eng
NDLC: UT51
Target Audience: 一般
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-2013-H382
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 024934169
http://id.ndl.go.jp/bib/024934169
Bibliographic Record Category (NDL): 213