図書

Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors 7 : 28 August 2013 : San Diego, California, United States : 2013 SPIE conference 8819, instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors 7 : Aug 2013, San Diego, CA. (SPIE Proceedings ; 8819)

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Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors 7 : 28 August 2013 : San Diego, California, United States : 2013 SPIE conference 8819, instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors 7 : Aug 2013, San Diego, CA.

(SPIE Proceedings ; 8819)

Call No. (NDL)
M17-14-1265
Bibliographic ID of National Diet Library
025019754
Material type
図書
Author
Postek, Michael T.ほか
Publisher
SPIE
Publication date
c2013.
Material Format
Paper
Capacity, size, etc.
1 v. (various pagings) ; 28 cm.
NDC
-
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Paper

Material Type
図書
ISBN
9780819496690
ISSN (series)
0277786X
Publication, Distribution, etc.
Publication Date
c2013.
Publication Date (W3CDTF)
2013