Materials and reliability handbook for semiconductor optical and electron devices

• Material Type: 図書
• ISBN: 9781461443360 (acidfree paper); 1461443369 (acidfree paper)
• ISBN (error code): 9781461443377 (eBook); 1461443377 (eBook)
• Title: Materials and reliability handbook for semiconductor optical and electron devices
• Author/Editor: Osamu Ueda, Stephen J. Pearton, editors.
• Author Heading: 上田, 修, 1950- ウエダ, オサム, 1950- ( 001339523 )Authorities; Pearton, S. J.
• Publication, Distribution, etc.: New York : Springer (出版)
• Publication Date: [2013]
• Publication Date (W3CDTF): 2013
• Extent: xv, 616 pages
• Other physical details: illustrations (some colour)
• Size: 24 cm
• Alternative Title: Semiconductor optical and electron devices
• Place of Publication (Country Code): US
• Text Language Code: eng
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Semiconductors--Materials.; Semiconductors--Reliability.; Optoelectronic devices--Materials.; Optoelectronic devices--Reliability.; Electronic apparatus and appliances--Materials.; Electronic apparatus and appliances--Reliability.; Optical materials.; Semiconducteurs--Matériaux.; Dispositifs électrooptiques--Fiabilité.; Composés semiconducteurs--Fiabilité.
• LCC: TK7871.85
• NDLC: ND371
• Target Audience: 一般
• Note (Bibliography): Includes bibliographical references and index.
• Collection (particular): 日本関係外国語図書
• Holding library: 国立国会図書館
• Call No.: ND371-B83
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 025143551; http://id.ndl.go.jp/bib/025143551
• LC Control Number: 2012947361; https://lccn.loc.gov/2012947361
• OCLC No.: 793572160; https://www.worldcat.org/oclc/793572160
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 211

• Contents: Materials issues and reliability of optical devices: Reliability testing of semiconductor optical devices / Mitsuo Fukuda. Failure analysis of semicon...