International conference on defects in semiconductors 2013 : proceedings of the 27th international conference on defects in semiconductors, ICDS-2013 : Bologna, Italy : 21-26 July 2013 : ICDS conferences : Jul 2013, Bologna, Italy. (AIP Conference Proceedings ; 1583)

International conference on defects in semiconductors 2013 : proceedings of the 27th international conference on defects in semiconductors, ICDS-2013 : Bologna, Italy : 21-26 July 2013 : ICDS conferences : Jul 2013, Bologna, Italy.

(AIP Conference Proceedings ; 1583)

Call No. (NDL): M17-14-2605
Bibliographic ID of National Diet Library: 025429217

Material type: 図書

Author: International Conference on Defects in Semiconductors (27th : 2013 : Bologna, Italy)ほか

Publisher: American Institute of Phsyics

Publication date: 2014.

Material Format: Paper

Capacity, size, etc.: 375 pages ; 27 cm.

NDC: -

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Notes on use

Note (General)：: Papers.Described as "... (ICDS-2013) was held in Bologna, Italy, July 22-26, 2013."--Preface."The conferences in this series, ... are held every 2 yea...

Other physical details：: illustrations

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Bibliographic Record

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Paper

Material Type: 図書
ISBN: 9781632660459 (Print on Demand)
9780735412156 (Original Print)
0735412154 (print)
ISSN (series): 0094-243X
Title: International conference on defects in semiconductors 2013 : proceedings of the 27th international conference on defects in semiconductors, ICDS-2013 : Bologna, Italy : 21-26 July 2013 : ICDS conferences : Jul 2013, Bologna, Italy.
Series Title: AIP Conference Proceedings ; 1583
Title Heading: AIP conference proceedings ; no. 1583.
Author Heading: International Conference on Defects in Semiconductors (27th : 2013 : Bologna, Italy)
Cavallini, A. (Anna)
Estreicher, Stefan K., 1952-
Publication, Distribution, etc.: Melville, New York : American Institute of Phsyics (出版)
Red Hook, NY : printed by Curran Associates, Inc. (製作)
Publication Date: 2014.
2014
Publication Date (W3CDTF): 2014
Extent: 375 pages
Other physical details: illustrations
Size: 27 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Conference proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Semiconductors--Defects--Congresses.
Semiconductors--Defects.
LCC: QC611.6.D4
NDLC: M17
Target Audience: 一般
Note (General): Papers.
Described as "... (ICDS-2013) was held in Bologna, Italy, July 22-26, 2013."--Preface.
"The conferences in this series, ... are held every 2 years ..."--Preface.
Described as "Following tradition, a tutorial day was held on July 21 ..."--Preface.
"Conference collection."
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-14-2605
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 025429217
http://id.ndl.go.jp/bib/025429217
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215