2013 IEEE international integrated reliability workshop : (IIRW 2013) : South Lake Tahoe, California, USA : 13-17 October 2013 : Oct 2013, South Lake Tahoe, CA.

• Material Type: 図書
• ISBN: 9781479903498
• ISSN: 1930-8841
• Title: 2013 IEEE international integrated reliability workshop : (IIRW 2013) : South Lake Tahoe, California, USA : 13-17 October 2013 : Oct 2013, South Lake Tahoe, CA.
• Author Heading: International Integrated Reliability Workshop (2013 : South Lake Tahoe, Calif.)
• Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
• Publication Date: [2013]; 著作権日付 : ©2013
• Publication Date (W3CDTF): 2013
• Extent: ix, 216 pages
• Other physical details: illustrations
• Size: 27 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Semiconductors--Reliability--Congresses.; Integrated circuits--Wafer-scale integration--Reliability--Congresses.; Integrated circuits--Reliability--Congresses.; Integrated circuits--Reliability.; Integrated circuits--Wafer-scale integration--Reliability.; Semiconductors--Reliability.
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers, abstracts and presentations.; IEEE catalog number CFP13IRW-POD.
• Note (Bibliography): Includes bibliographical references.
• Holding library: 国立国会図書館
• Call No.: M17-15-1043
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 025606868; http://id.ndl.go.jp/bib/025606868
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215