2014 IEEE 32nd VLSI test symposium : (VTS 2014) : Napa, California, USA : 13-17 April 2014 : TTTC-sponsored technical meetings : Apr 2014, Napa, CA.

Call No. (NDL): M17-15-2218
Bibliographic ID of National Diet Library: 026355457

Material type: 図書

Author: IEEE VLSI Test Symposium (2014 : Napa, CA)

Publisher: IEEE

Publication date: [2014]

Material Format: Paper

Capacity, size, etc.: 293 pages ; 27 cm

NDC: -

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Note (General)：: Papers and abstracts."Welcome to VTS 2014, the thirty second in a series of annual symposia ..."--Foreword.Described as "The core of VTS 2014, the thr...

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Paper

Material Type: 図書
ISBN: 9781479926121
1479926124
Title: 2014 IEEE 32nd VLSI test symposium : (VTS 2014) : Napa, California, USA : 13-17 April 2014 : TTTC-sponsored technical meetings : Apr 2014, Napa, CA.
Author Heading: IEEE VLSI Test Symposium (2014 : Napa, CA)
Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
Publication Date: [2014]
Publication Date (W3CDTF): 2014
Extent: 293 pages
Size: 27 cm
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Conference proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Integrated circuits--Very large scale integration--Testing--Congresses.
Integrated circuits--Very large scale integration--Testing.
NDLC: M17
Target Audience: 一般
Note (General): Papers and abstracts.
"Welcome to VTS 2014, the thirty second in a series of annual symposia ..."--Foreword.
Described as "The core of VTS 2014, the three-day technical program, responds to ... In addition to the three-day paper sessions, VTS 2014 features several special sessions including ... and an embedded tutorial."--Foreword.
IEEE catalog number CFP14029-POD.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-15-2218
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 026355457
http://id.ndl.go.jp/bib/026355457
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215