2015 international conference on microelectronic test structures : (ICMTS 2015) : Tempe, Arizona, USA : 23-26 March 2015 : 2015 IEEE international conference on microelectronic test structures : Mar 2015, Tempe, AZ.

• Material Type: 図書
• ISBN: 9781479983056
• Title: 2015 international conference on microelectronic test structures : (ICMTS 2015) : Tempe, Arizona, USA : 23-26 March 2015 : 2015 IEEE international conference on microelectronic test structures : Mar 2015, Tempe, AZ.
• Author Heading: IEEE International Conference on Microelectronic Test Structures (2015 : Tempe, Ariz.)
• Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
• Publication Date: [2015]; 著作権日付 : ©2015
• Publication Date (W3CDTF): 2015
• Extent: vii, 239 pages
• Size: 27 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Integrated circuits--Testing--Congresses.; Semiconductors--Testing--Congresses.; Electronic apparatus and appliances--Testing--Congresses.; Electronic apparatus and appliances--Testing.; Integrated circuits--Testing.; Semiconductors--Testing.
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers.; IEEE catalog number CFP15MTS-POD.
• Note (Bibliography): Includes bibliographical references.
• Holding library: 国立国会図書館
• Call No.: M17-15-3236
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 026721134; http://id.ndl.go.jp/bib/026721134
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215