Search by Bookstore
Search by Bookstore
Bibliographic Record
You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.
- Material Type
- 図書
- ISBN
- 9781479983056
- Author Heading
- Publication, Distribution, etc.
- Publication Date
- [2015]著作権日付 : ©2015
- Publication Date (W3CDTF)
- 2015
- Extent
- vii, 239 pages
- Size
- 27 cm
- Additional Title
- 2015 IEEE international conference on microelectronic test structures : Mar 2015, Tempe, AZ.