Defects and impurities in silicon materials : an introduction to atomic-level silicon engineering

• Material Type: 図書
• ISBN: 978-4-431-55799-9
• ISSN (series): 0075-8450
• Title: Defects and impurities in silicon materials : an introduction to atomic-level silicon engineering
• Author/Editor: Yutaka Yoshida, Guido Langouche editors
• Series Title: Lecture notes in physics ; volume 916
• Author Heading: 吉田, 豊, 1954- ヨシダ, ユタカ, 1954- ( 00754016 )Authorities; Langouche, Guido ( 001233239 )Authorities
• Publication, Distribution, etc.: Tokyo : Springer
• Publication Date: c2015
• Publication Date (W3CDTF): 2015
• Extent: 487p
• Size: 24cm
• Place of Publication (Country Code): JP
• Text Language Code: eng
• NDLC: PA431
• Target Audience: 一般
• Note (Bibliography): 文献あり
• Holding library: 国立国会図書館
• Call No.: PA431-B169
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 026784695; http://id.ndl.go.jp/bib/026784695
• National Bibliography No. (JPNO): 22746211
• Cataloging Rule: Nippon Cataloguing Rules 1987 Revised Edition
• Bibliographic Record Category (NDL): 111

• Contents: Diffusion and point defects in silicon materials / Hartmut Bracht 著Density functional modeling of defects and impurities in silicon materials / José C...