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図書

2014 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFT 2014) : Amsterdam, Netherlands : 1-3 October 2014 : Oct 2014, Amsterdam, the Netherlands.

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2014 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFT 2014) : Amsterdam, Netherlands : 1-3 October 2014 : Oct 2014, Amsterdam, the Netherlands.

Call No. (NDL)
M17-16-1280
Bibliographic ID of National Diet Library
027262679
Material type
図書
Author
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (2014 : Amsterdam, the Netherlands)
Publisher
IEEE
Publication date
[2014]
Material Format
Paper
Capacity, size, etc.
xvi, 304 pages ; 28 cm
NDC
-
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Abstracts and papers."... we welcome you to twenty-seventh edition of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanot...

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Paper

Material Type
図書
ISBN
9781479961566 (print)
Publication, Distribution, etc.
Publication Date
[2014]
著作権日付 : ©2014
Publication Date (W3CDTF)
2014
Extent
xvi, 304 pages
Other physical details
illustrations
Size
28 cm