2015 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFTS 2015) : Amherst, Massachusetts, USA : 12-14 October 2015 : DFT 2015 : Oct 2015, Amherst, MA.

• Material Type: 図書
• ISBN: 9781479986316
• ISSN: 1550-5774
• Title: 2015 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFTS 2015) : Amherst, Massachusetts, USA : 12-14 October 2015 : DFT 2015 : Oct 2015, Amherst, MA.
• Author Heading: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (2015 : Amherst, Mass.)
• Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
• Publication Date: [2015]; 著作権日付 : ©2015
• Publication Date (W3CDTF): 2015
• Extent: xiv, 236 pages
• Other physical details: illustrations
• Size: 28 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Integrated circuits--Very large scale integration--Congresses.; Nanotechnology--Congresses.; Integrated circuits--Fault tolerance--Congresses.; Integrated circuits--Fault tolerance; Integrated circuits--Very large scale integration.; Nanotechnology.
• LCC: TK7874.75
• NDLC: M17
• Target Audience: 一般
• Note (General): Abstracts, program and papers.; "... we welcome you to the twenty-eighth edition of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2015) ..."--Welcome message.; IEEE catalog number CFP15078-POD.
• Note (Bibliography): Includes bibliographical references.
• Holding library: 国立国会図書館
• Call No.: M17-17-636
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 027596740; http://id.ndl.go.jp/bib/027596740
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215