2015 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFTS 2015) : Amherst, Massachusetts, USA : 12-14 October 2015 : DFT 2015 : Oct 2015, Amherst, MA.

Call No. (NDL): M17-17-636
Bibliographic ID of National Diet Library: 027596740

Material type: 図書

Author: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (2015 : Amherst, Mass.)

Publisher: IEEE

Publication date: [2015]

Material Format: Paper

Capacity, size, etc.: xiv, 236 pages ; 28 cm

NDC: -

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Notes on use

Note (General)：: Abstracts, program and papers."... we welcome you to the twenty-eighth edition of the IEEE International Symposium on Defect and Fault Tolerance in VL...

Other physical details：: illustrations

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Paper

Material Type: 図書
ISBN: 9781479986316
ISSN: 1550-5774
Title: 2015 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFTS 2015) : Amherst, Massachusetts, USA : 12-14 October 2015 : DFT 2015 : Oct 2015, Amherst, MA.
Author Heading: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (2015 : Amherst, Mass.)
Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
Publication Date (W3CDTF): 2015
Extent: xiv, 236 pages
Other physical details: illustrations
Size: 28 cm
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Conference papers and proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Integrated circuits--Very large scale integration--Congresses.
Nanotechnology--Congresses.
Integrated circuits--Fault tolerance--Congresses.
Integrated circuits--Fault tolerance
Integrated circuits--Very large scale integration.
Nanotechnology.
LCC: TK7874.75
NDLC: M17
Target Audience: 一般
Note (General): Abstracts, program and papers.
"... we welcome you to the twenty-eighth edition of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2015) ..."--Welcome message.
IEEE catalog number CFP15078-POD.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-17-636
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 027596740
http://id.ndl.go.jp/bib/027596740
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215